EMMC153 EMMC169 Flip Shrapnel To SD Interface Test Socket Burning Socket for Data Recovery Mobile Phone Repair
EMMC153 EMMC169 Flip Shrapnel To SD Interface Test Socket Burning Socket for Data Recovery Mobile Phone Repair
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Description
EMMC153 EMMC169 Flip Shrapnel To SD Interface Test Socket is a test block designed for integrated circuit (IC) testing. It is used in mobile phone repair to facilitate data recovery by connecting ICs to a computer via an SD interface.
- Type: Test block
- Interface type: SD
- Application: Integrated circuit (IC)
- Test method:
- Select the limit frame that matches the IC and place the IC flat in the socket according to the direction.
- Insert the SD interface into the card reader and connect to the computer, selecting the corresponding test program.
- Compatibility:
- Compatible with 169-FBGA and 153-FBGA ICs
- Materials:
- Shrapnel made of imported beryllium copper with high-precision die stamping
- Gold plating on hardened and thickened head shape for stability and durability
- Features:
- Compatible with ball and no ball test; IC limit frame can be replaced
- Overall structure of contact module reduces repeated positioning issues
- High pass rate in one test due to accurate alignment with IC PAD
- Welding structure ensures good contact and stable testing
- Flip cover structure for convenient manual testing
- Mold integral molding and spring self-adaptive structure for ICs of varying thickness (0.6-2.0MM)
- Injection molding for precise positioning and higher work efficiency
- Repair and maintenance:
- Use an air gun or anti-static brush to remove impurities from the socket seat
- Clean the socket with absolute alcohol to remove impurities from the shrapnel
- Replace shrapnel if burned or broken
- Ensure USB interface is not plugged in during detection
- Avoid cleaning with organic solvents to prevent damage
- Seal with an anti-static bag when not in use for extended periods
Questions about features, compatibility, or warranty? Chat with our local support team!
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